کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7173479 1464518 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Two efficient iterative algorithms for error prediction in peripheral milling of thin-walled workpieces considering the in-cutting chip
ترجمه فارسی عنوان
دو الگوریتم تکرار کارآیی برای پیش بینی خطا در فرزند محصور کارهای نازک دیواره با توجه به تراشه درونی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی صنعتی و تولید
چکیده انگلیسی
Due to the deflection of tool and workpiece induced by cutting force, there is a high complexity associated with the prediction of surface form errors in peripheral milling of thin-walled workpieces. Based on the systematic study of in-cutting chip, this paper proposes a new efficient iterative algorithm named flexible iterative algorithm (FIAL), which is suitable for surface form errors prediction in peripheral milling of low rigid thin-walled workpiece. In FIAL, an iterative scheme for calculations of tool/workpiece (TW) deflections are developed by considering the former convergence cutting position, and in the scheme a new important variable Δ is proposed for the calculation of radial cutting depth which never been considered before. Based on FIAL and the analytical study of in-cutting chip, a double iterative algorithm (DIAL) is brought forwarded to calculate the positions and magnitude of the maximum surface form errors, which always take the peak point include in each iterative step. Comparisons of the form errors and cutting forces obtained numerically and experimentally confirm the validity of the proposed algorithms and simulation procedure. The experimental and analytical results have shown that FIAL is faster in the iteration convergent speed and more accurate than the rigid iterative algorithm in surface form errors prediction, and DIAL is proved to be valid in the maximum errors prediction.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Machine Tools and Manufacture - Volume 73, October 2013, Pages 55-61
نویسندگان
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