Maximum output voltage and frequency of single electron tunneling inverter for variable temperature and load capacitance

Studying of single electronics should consider both the temperature and the circuit capacitance as being the most important parameters that affect the behavior of SET devices. In this letter, the delay and the output voltage level in the single electron tunneling inverter are investigated for a wide range of temperature and load capacitance. Due to the stochastic nature of the electron transports in single electronics, the results are considered to be the average of many Monte Carlo computations.