SELF-TUNING PI CONTROLLER

A self-tuning algorithm comprising the steps of identification and tuning is proposed. The methodology of process parameters identification is based on the measurement of the locus of a perturbed relay system (LPRS) points from a single or multiple asymmetric relay feedback tests. An algorithm of identification of the first order plus dead time process model is developed in details. Also, a tuning algorithm using the criterion of minimal settling time subject to the overshoot constraints is developed and presented in the form of simple formulas for the first-order plus dead time process model. Examples of simulations and application are given.