کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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724707 | 1461329 | 2009 | 5 صفحه PDF | دانلود رایگان |
High resolution three-dimensional space charge cartographies obtained on 50 μm PTFE samples by using FLIMM technique are presented in this article. Samples were irradiated by a 30 keV electron beam. Charges were injected according to the grid pattern put on the sample during irradiation. A new measurement strategy associated with a new set-up leads to an improvement in measurements accuracy and precision. With this new strategy, measurements were performed rapidly, at a chosen depth and with a low lateral resolution in order to map the space charge profile in the whole sample and to choose a study area. After selecting an interesting area, space charge cartographies were carried out with a very high lateral resolution of about 1 μm. The irradiated zones according to the grid pattern were well reconstructed and the injection depth did not exceed 4 μm.
Journal: Journal of Electrostatics - Volume 67, Issues 2–3, May 2009, Pages 430–434