کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
731016 | 1461563 | 2016 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectroscopic ellipsometry technique as a materials characterization tool for mechatronic systems—The case of composition and doping concentration monitoring in SBN crystals
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Spectroscopic ellipsometry technique as a materials characterization tool for mechatronic systems—The case of composition and doping concentration monitoring in SBN crystals Spectroscopic ellipsometry technique as a materials characterization tool for mechatronic systems—The case of composition and doping concentration monitoring in SBN crystals](/preview/png/731016.png)
چکیده انگلیسی
The paper aims to provide spectroscopic ellipsometry technique as a tool for sensor materials studies. The principles of measurement, the ellipsometric data evaluation and the standard rotating analyzer configuration of the ellipsometric instrument are introduced. The possibilities and the limitations of spectroscopic ellipsometry technique for material studies attractive from the point of view of optoelectronic sensors and micro electro-mechanical sensors and actuators applications are discussed. Studies of composition and the Ce3+ doping level for ferroelectric strontium barium niobate crystals are presented as an example of possible non-straightforward application of this technique.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Mechatronics - Volume 37, August 2016, Pages 33–41
Journal: Mechatronics - Volume 37, August 2016, Pages 33–41
نویسندگان
Krzysztof Dorywalski, Igor Maciejewski, Tomasz Krzyżyński,