Symmetric surface plasmon resonance sensing structure excited by a planar waveguide

In this paper, we describe a novel waveguide surface plasmon resonance sensing structure, which consists of a symmetric structure and a planar waveguide. The core component is the symmetric structure of the metal layer, tested sample, and metal layer. The refractive index matching condition of this structure can be adjusted through the thickness of the sample. The planar waveguide is used to excite the surface plasmon wave, and then the parameters are tested and analyzed. The surface plasmon wave is excited when glycerin solutions with concentrations of 0%–70% are used to detect at thicknesses of 300 and 500 nm. The problem that the effective refractive index of the ion exchange planar waveguide is large and using this index to excite the surface plasmon wave between the metal and dielectric for detection is difficult to achieve can be countered by appropriately choosing the thickness of the dielectric in order to be able to measure different refractive indices.

► We model the symmetric structure of SPR.
► Refractive index distribution of the planar waveguide is fitted.
► Symmetric structure of SPR is analyzed.
► Parameters of the planar waveguides are detected and analyzed.
► Refractive index of the sampled is detected by the symmetric structure of SPR.