Ellipsometric study of preformatted surface structure of optical disc

Investigations of optical disc with standard preformatted structure are carried out by null-ellipsometry method. Model of the surface structure of optical disc based on the scalar theory of diffraction is examined. Adequacy of the model suggested to real state of surface for different experimental configurations is estimated. Sensitivity of ellipsometry technique to changes of the optical disc surface structure is determined for two models with different optical parameters of the surface film (n1=1.6; k1=0.02 and n1=1.7; k1=0.3). Minimum changes of microstructure parameters, which can be registered by ellipsometric measurements, are assessed.