کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
733115 893317 2007 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Study on Fourier transforms profilometry based on bi-color projecting
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Study on Fourier transforms profilometry based on bi-color projecting
چکیده انگلیسی

Projecting a bicolor sinusoidal fringe pattern consisting of two interlaced RGB format base color fringe patterns with π phase difference onto an object thought digital light projector, we can capture a deformed color pattern by color digital camera, then decode two individual sinusoidal fringe patterns with π phase difference by color-separating technique. Accessing these two fringe patterns, not only are zero-order spectra eliminated, but mask function is also built to mark valid unwrapping area in FTP, automatically.Moreover, because the wrapped phase just inside the valid areas is needed unwrapping, we can mark these areas with mask function, which avoids the error transferring resulting from unwrapping the invalid areas and shortens the unwrapping time. Furthermore, in Fourier transform processing, the full-field deformed fringe pattern generally needed to guarantee measurement precision can be formed by expanding non-full-field fringe pattern captured using the mask function.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics & Laser Technology - Volume 39, Issue 4, June 2007, Pages 821–827
نویسندگان
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