کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
734262 893408 2007 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
An enhanced common path interference optic measurement system for refractive indices and thickness
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
An enhanced common path interference optic measurement system for refractive indices and thickness
چکیده انگلیسی

This study proposes a common path interference optical system for the measurement of refractive indices and thickness of uniaxial crystal material. The measurement system comprises an accurate Mach–Zehnder laser interferometer, a single-axis rotary stepping motor, and a computer. The laser interferometer is composed of a single-frequency He–Ne laser, two-beam splitters and two reflectors. The Mach–Zehnder laser interferometer measures the optical length difference by using its linear measurement accuracy. The proposed solution procedure enables both the refractive indices and the thickness of the optical waveplate to be obtained. The proposed design differs from conventional designs in that it does not use a heterodyne modulator with a lock-in technique. It is shown that the refractive indices and thickness of the tested optical elements can be measured rapidly and accurately.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics & Laser Technology - Volume 39, Issue 3, April 2007, Pages 500–506
نویسندگان
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