A microscope system based on bevel-axial method auto-focus

A microscope system based on bevel-axial method auto-focus (BAM-AFS) is proposed. The purpose is to establish an auto-focus microscope system that calculates the focus position one or many times. In this paper, we propose a bevel-axial method that had an included angle between CCD sensor and image plane with multi-parameters fusing from image to obtain the in-focus position directly in the first phase and combined Kalman estimate to obtain the in-focus position for different objects in the second phase. We discuss the relation between focus positions and image focus at the end.