کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
735239 893588 2009 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Optimal ablation of fluorine-doped tin oxide (FTO) thin film layers adopting a simple pulsed Nd:YAG laser with TEM00 mode
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Optimal ablation of fluorine-doped tin oxide (FTO) thin film layers adopting a simple pulsed Nd:YAG laser with TEM00 mode
چکیده انگلیسی

In material processing, a laser system with optimal laser parameters has been considered to be significant. Especially, the laser ablation technology is thought to be very important for fabricating a dye-sensitized solar cell (DSSC) module with good quality. Moreover, the TEM00 mode laser beam is the most dominant factor to decide the incident photon to current conversion efficiency (IPCE) characteristics. In order to get the TEM00 mode, a pin-hole is inserted within a simple pulsed Nd:YAG laser resonator. And the spatial field distribution is measured by using three pin-hole diameters of 1.6, 2.0 and 4.0 mm, respectively. At that moment, each case has the same laser beam energy by adjusting the discharge voltage and pulse per second (pps). From those results, it is known that the pin-hole size of 1.6 mm has the perfect TEM00 mode. In addition, at the charging voltage of 1000 V, 10 pps, the feeding speed of 6.08 mm/s and the overlapping rate (OL) of 62%, the scanning electron microscope (SEM) photograph of fluorine-doped tin oxide (FTO) thin film layers shows the best ablation trace.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 47, Issue 5, May 2009, Pages 558–562
نویسندگان
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