Advanced iterative algorithm for randomly phase-shifted interferograms with intra- and inter-frame intensity variations

The fundamental concept of the advanced iterative algorithm is reviewed and a detailed procedure for implementation is presented. Computer simulations are conducted to evaluate its performance for truly random phase-shifted interferograms with intra- and inter-frame intensity variations. The algorithm is implemented for random phase shifts encountered during thermal warpage measurement of a microelectronics subassembly subjected to convective thermal loading.