کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
735930 893684 2008 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
High-resolution dynamic measurement using electronic speckle pattern interferometry based on multi-camera technology
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
High-resolution dynamic measurement using electronic speckle pattern interferometry based on multi-camera technology
چکیده انگلیسی

The speckle interferometer based on multi-camera technologies using two cameras is applied to a dynamic measurement. The new speckle interferometer is constructed by a prism array and two cameras. A phenomenon, which a bearing-ball collides against a thin polymer film, is investigated by the proposed interferometer. Then, it is shown that the local maximum deformation of the thin film by the collision is about 1.0 μm. Such a deformation process can precisely be analyzed by this method without any troubles of optical dislocations. In the results, it is confirmed that a large deformation process can be analyzed by accumulating measured results of small deformation in every small continuous analysis. Furthermore, it is estimated that the measurement precision of this method is about 5 nm as experimental results.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 46, Issue 10, October 2008, Pages 733–738
نویسندگان
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