Measurement errors in the scanning of resistive sensor arrays

In this study, firstly, the methods presented in the literature to weaken the effect of the crosstalk between adjacent elements of resistive sensor arrays are discussed, and each method is subdivided into several sub-methods. Then, the crosstalk due to the presence of parasitic parallel paths is illustrated, and the simplest circuit based on each sub-method is structured in order to decrease the complexity of the circuits presented in the literature. After that, the measurement errors, which are on the voltage read in correspondence to the selected element resistance, of the circuits with respect to different parameters are evaluated and compared in simulations. At last, the simulation results are comparatively analyzed, while some guidelines are given for the use of the scanning circuits.