Application of the theory of micro switch group sensor (MSGS) to noise-affected switches

Although microsystem technology (MST) has facilitated the fabrication of a large number of small devices, such devices tend to have errors caused by the inaccuracy of the fabrication process and thermally induced noise fluctuations. In previous work, the concept of the Micro Switch Group Sensor (MSGS) was introduced using the example of a device that exploits the randomness of brittle material fracture, in particular the Weibull distribution. In this paper, the Gaussian distribution of noise signals is applied to the theory of MSGS. An MSGS device made of an electric circuit consisting of three noise-affected switches was built in the experimental work and its operational principles are discussed. The device's output signal was compared with the performance of each of the switches, and the theory of MSGS was verified.