کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
739393 | 1461642 | 2014 | 6 صفحه PDF | دانلود رایگان |
• A method to measure thickness variation and optical inhomogeneity simultaneously is proposed.
• A dual-wavelength phase-shifting photorefractive holographic interferometer is used.
• Special requirements and additional operations on surfaces are not needed.
• The wavefront distortion caused by the interferometer system can be compensated automatically.
A method to measure thickness variation and optical inhomogeneity simultaneously with a dual-wavelength phase-shifting photorefractive holographic interferometer is proposed. This method has no special requirements on the sample surfaces, and additional operations such as coating refractive index matching liquid on surfaces is not needed. With the help of photorefractive holographic interferometry, the wavefront distortion caused by the interferometer system is compensated automatically. Compared with other methods, this method is simpler and more accurate. Computer simulation and optical experiment have verified its feasibility and reliability.
Journal: Optics & Laser Technology - Volume 56, March 2014, Pages 241–246