کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
740921 894201 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Highly-sensitive reflectometry setup capable of probing the electrical double layer on silica
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
Highly-sensitive reflectometry setup capable of probing the electrical double layer on silica
چکیده انگلیسی

This study describes an optical reflectometry setup capable of detecting adsorption at a liquid/solid interface. This setup has improved sensitivity over the previous reflectometry instruments discussed in the literature. This improvement is achieved by implementing a stabilized He–Ne laser and lock-in detection scheme. The high sensitivity of the present setup was demonstrated by probing the formation of the electrical double layer at the water–silica interface. Quantitative interpretation of the data was achieved with the basic Stern model. The determined value of the single-ion refractive index increment for Na+ was 7.1 ± 0.2 mL/mol. The detection limit of the present setup is <1 μg/m2, which is comparable to modern surface plasmon resonance instruments, and is 10 times better than currently achieved with quartz crystal microbalances and other optical surface sensitive techniques.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators B: Chemical - Volume 151, Issue 1, 26 November 2010, Pages 250–255
نویسندگان
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