Characterization of metal-oxide nanosensors fabricated with focused ion beam (FIB)

A procedure to contact single metal-oxide nanowires and nanoparticles of different materials using a Dual Beam FIB has been developed. The quality of the electrical contacts has been evaluated and the possibility of extracting the electrical parameters of these nanowires and nanoparticles demonstrated. The response of some of them to different gases is presented, proving the feasibility of fabricating metal-oxide nanosensors.