Stress intensity factor analysis of an interfacial corner between piezoelectric bimaterials using the H-integral method

Asymptotic solutions around the interfacial corner between piezoelectric bimaterials can be obtained by the combination of the Stroh formalism and the Williams eigenfunction expansion method. Based on an extension of the Stroh formalism and the H-integral derived from Betti’s reciprocal principle for piezoelectric problems, we analyzed the stress intensity factors (SIFs) and asymptotic solutions of piezoelectric bimaterials. The eigenvalues and eigenvectors of an interfacial corner between dissimilar piezoelectric anisotropic materials are determined using the key matrix. The H-integral for piezoelectric problems is introduced to obtain the scalar coefficients, which are related to the SIFs. We propose a new definition of the SIFs of an interfacial corner for piezoelectric materials, and we demonstrated the accuracy of the SIFs by comparing the asymptotic solutions with the results obtained by the finite element method (FEM) with very fine meshes.

► We proposed a new definition of SIFs of a piezoelectric interfacial corner.
► We extended the H-integral to get the SIFs of a piezoelectric interfacial corner.
► Obtained SIFs can describe the unique asymptotic solutions of the corner.
► Obtained SIFs will be applied for the reliability evaluation of the corner.