Development of an angle-scanning spectropolarimeter: Preliminary results

A fixed-angle spectropolarimeter capable of measuring the Mueller matrix of particle deposits and conventional optical elements over the 300-1100 nm spectral range has been built, calibrated and extensively tested. A second generation of this instrument is being built which can scan from 0° to near 180° in both scattering angle and sample orientation, enabling studies of the bidirectional Mueller matrices of nanoparticle arrays, atmospheric aerosol deposits, and nano- and microstructured surfaces. This system will also provide a much needed metrology capability for fully characterizing the performance of optical devices and device components from the near-infrared through the medium wave ultraviolet. Experimental results taken using the first generation fixed-angle arrangement will be presented along with the rationale for building the second.