کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8153083 1524761 2018 17 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Robustness of majority gates based on nanomagnet logic
ترجمه فارسی عنوان
پایداری دروازه های اکثریت بر اساس منطق نانومغناطیس
کلمات کلیدی
منطق نانومغناطیس، اثرات کران مغناطیسی، میکروسکوپ نیروی مغناطیسی، میکرومغناطیس،
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
چکیده انگلیسی
We studied the evolution of the magnetic state of a majority logic gate consisting of a cluster of five dipolarly-coupled nanomagnets, fabricated by e-beam lithography, under the application of a clocking field, using a combination of magneto-optical Kerr effect and magnetic force microscopy. The data were interpreted by advanced GPU-based micromagnetic simulations, where, in addition to the single ideal-shaped gate, a 3 × 3 array of “realistic gates”, whose shape is directly derived from scanning electron microscopy images, is considered. A fairly good agreement between measurements and simulations has been achieved, showing that asynchronous switching of nominally identical gates may occur, because of unavoidable structural and morphological imperfections. Moreover, a slight misalignment of 1°−2° of the clocking field with respect to the hard axis of the dots may be detrimental for the correct logic operation of the gates. It follows that reliable, error-free and reproducible operations in future magnetologic devices would require tight control and precision of both the lithographic process and the direction of the clocking field. Moreover, a significant improvement could be insured by a stronger dipolar coupling between the dots, for instance increasing their thickness and/or using materials with larger magnetization.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 460, 15 August 2018, Pages 432-437
نویسندگان
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