کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8207461 1530934 2017 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
RBS Analysis of Down-conversion Layers Comprising Two Rare-Earth Elements
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک و نجوم (عمومی)
پیش نمایش صفحه اول مقاله
RBS Analysis of Down-conversion Layers Comprising Two Rare-Earth Elements
چکیده انگلیسی
Rutherford Backscattering Spectroscopy (RBS) of samples containing two rare-earth elements is difficult owing to the small mass separation of even the lightest and heaviest members of the group. In studies of the growth of silicon nitride down-conversion layers, compatible with silicon photovoltaic technology, 2-3 MeV RBS has been combined with RBS at 5 MeV and alpha PIXE, to determine the composition of samples grown with different amounts of cerium and ytterbium. The films were produced using reactive magnetron co-sputtering. Conventional RBS at 2.2 MeV is used to determine the nitrogen and oxygen and silicon content of the films. At this energy, elements from carbon upwards have scattering cross-sections determined by the Coulomb potential. However, the cerium and ytterbium peaks at this energy merge into one and make it very difficult to determine the ratio of these elements and the absolute amount of each element. At 5 MeV sufficient separation was achieved between the cerium and ytterbium peaks that their ratio and absolute amount could be measured. At this energy the scattering from these elements is still determined by the Coulomb potential. For all the other elements in the sample the Coulomb barrier has been exceeded such that data from them is unusable. Care also needs to be taken to ensure there is no interference between the rare-earth scattering peaks in the spectrum and products of nuclear reactions from the lower Z-elements.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physics Procedia - Volume 90, 2017, Pages 32-40
نویسندگان
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