Dielectric breakdown model for a conductive crack and electrode in piezoelectric materials

The strip dielectric breakdown (DB) model introduced by Zhang and Gao [T.Y. Zhang, C.F. Gao, Fracture behavior of piezoelectric materials, Thero. Appl. Fract. Mech. 41 (2004) 339–379] is used to study the generalized 2D problem of a conductive crack and an electrode in an infinite piezoelectric material. The energy release rate and stress intensity factors are derived based on the Stroh formalism, and then they are applied as failure criteria to predict the critical fracture loads. It is found that the DB strip may take the shielding effect on a conductive crack or electrode. For the case of an electrode, the local energy release rate and stress intensity factor become zero when DB happens ahead of the electrode tip. For the case of a mode-I conductive crack in a transversely isotropic piezoelectric solid, the results based on the DB model show that the critical stress intensity factor linearly increases as the applied electric field parallel to the poling direction increases, while it linearly decreases as the applied electric field anti-parallel to the poling direction increases. Finally, the upper and lower bounds of the actual critical fracture loads are proposed for a conductive crack in a piezoelectric material under combined mechanical–electrical loads.