کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
865560 909674 2009 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
ILT Approach for Compensating 3-D Mask Effects
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی (عمومی)
پیش نمایش صفحه اول مقاله
ILT Approach for Compensating 3-D Mask Effects
چکیده انگلیسی
As mask features scale to smaller dimensions, the so-called “3-D mask effects” which have mostly been neglected before, become important. This paper properly models the 3-D thick mask effects, and then analyses the object-based inverse lithography technique using a simulated annealing algorithm to determine the mask shapes that produce the desired on-wafer results. Evaluations against rigorous simulations show that the synthesized masks provide good image fidelity up to 0.94, and this approach gives improved accuracy and faster results than existing methods.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Tsinghua Science & Technology - Volume 14, Issue 1, February 2009, Pages 68-74
نویسندگان
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