Measurement of angular dependence from L3-subshell to M-shell vacancy transfer probabilities for the elements in the atomic region 71⩽Z⩽78

The angular dependence of L3-subshell to M-shell vacancy transfer probabilities for the elements Lu, Hf, Ta, W, Os and Pt have been measured at the excitation energies of 5.96keV and K X-rays of Zn, Ga, Ge, and As, respectively, at seven angles varying from 120° to 150°. Energies of K X-rays are above the L3 edge but below L2 edge energies of the respective target elements under reference; therefore, the M X-rays are produced not only due to direct interaction of incident photons with M-shell electron but also due to the decay of L3-subshell vacancies to M-shell. Because the angular dependence from L3-subshell to M-shell vacancy transfer probabilities is not found in the literature, to the best of our knowledge there are no experimental values for worked elements. Therefore, the results for the elements obtained in the present study constitute the first experimental measurements and no comparison was made with other experimental and theoretical results. It has been observed that angular dependence from L3-subshell to M-shell vacancy transfer probabilities increases with increasing cosθ.