Thermal and thermoelastic dynamic analysis with finite element analysis, application to photothermal and thermoelastic microscopies

Photothermal and thermoelastic microscopies generally work with lock-in detection. In order to better understand related magnitude and phase images obtained with complex geometries, we develop a finite element analysis (FEA) dynamic method that enables to directly obtain both thermal and thermoelastic fields. It has been applied to thermoelastic microscopy and has shown very good agreement with experiments.