A numerical investigation of dopant segregation by modified vertical gradient freezing with moderate magnetic and weak electric fields

The paper numerically investigates melt growth of doped gallium-antimonide (GaSb) semiconductor crystals by the vertical gradient freeze (VGF) method utilizing a submerged heater. Electromagnetic (EM) stirring can be induced in the gallium-antimonide melt just above the crystal growth interface by applying a small radial electric current in the melt together with an axial magnetic field. The transport of any dopant by the stirring can promote better compositional homogeneity. This investigation presents a numerical model for the unsteady transport of a dopant during the VGF process by submerged heater growth with a moderate axial magnetic field and a weak electric field. Numerical predictions of the dopant distributions in the crystal and in the melt at several different stages during growth are presented.