کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9834540 | 1524911 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Investigations on annealed Ni-P in Al-Mg/Ni-P substrates as soft underlayer for perpendicular recording media
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Investigations on annealed Ni-P in Al-Mg/Ni-P substrates as soft underlayer for perpendicular recording media Investigations on annealed Ni-P in Al-Mg/Ni-P substrates as soft underlayer for perpendicular recording media](/preview/png/9834540.png)
چکیده انگلیسی
The amorphous Ni-P layer in the Al-Mg substrates of longitudinal recording media have been annealed to form soft magnetic underlayer for perpendicular recording media. After annealing at about 300 °C for 10 min, the Ni-P layer crystallized and was found to have Ni3P and Ni phases. The annealed samples were found to have soft magnetic properties. As the annealing temperature was increased, the samples showed a larger coercivity. The optical surface analyzer (OSA) results indicated that crystallized Ni-P could show lower noise than sputtered Ni-Fe thin films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 287, February 2005, Pages 271-275
Journal: Journal of Magnetism and Magnetic Materials - Volume 287, February 2005, Pages 271-275
نویسندگان
S.N. Piramanayagam, H.B. Zhao, M. Dewi, B.C. Lim,