کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9868385 | 1530689 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Critical line between the first-order and the second-order phase transition for ferroelectric thin films described by TIM
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک و نجوم (عمومی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Critical line between the first-order and the second-order phase transition for ferroelectric thin films described by TIM Critical line between the first-order and the second-order phase transition for ferroelectric thin films described by TIM](/preview/png/9868385.png)
چکیده انگلیسی
In this Letter, we apply the transverse-field Ising model (TIM) with a four-body interaction term to ferroelectric thin films. By defining a critical value (Jâ²/J)c, the critical line between the first-order and the second-order phase transition is obtained for ferroelectric thin films. We discuss influence of the film thickness on the critical value (Jâ²/J)c. Behavior of the phase transition and the dielectric susceptibility of ferroelectric thin films are investigated within the mean-field approximation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physics Letters A - Volume 336, Issues 2â3, 7 March 2005, Pages 216-222
Journal: Physics Letters A - Volume 336, Issues 2â3, 7 March 2005, Pages 216-222
نویسندگان
Qing Jiang, Yong Mei Tao,