Keywords: 06.20.-f; Chromium atomic deposition grating; Dimension properties; Metrological AFM; 06.20.âf; 06.20.fb;
مقالات ISI 06.20.-f (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Uncertainty assessment of Si molar mass measurements
Keywords: 06.20.-f; 82.80.Ms; 07.75.+h; 06.20.âf; 06.20.Dk; 62P35; 92E99; Isotope ratio mass spectrometry; Si molar mass; Metrology; Measurement uncertainty;
Uncertainty analysis of whole-field phase-differences retrieved from ESPI fringe patterns by using the Fourier transform method (FTM)
Keywords: 06.20.-f; 06.20.âf; 07.60.Ly; 42.30.Ms; 42.15.Dp; Optical metrology; Electronic speckle pattern interferometry (ESPI); Sensitivity vector;
Enhancing the signal-to-noise ratio of optical frequency beating using open-loop photonic crystal fiber
Keywords: 06.20.-f; 06.20.âf; 42.62.Eh; 06.30.Ft; Optical frequency comb; Frequency standard; Absolute frequency measurement; Photonic crystal fiber; Supercontinuum;
Shape measurement by multi-illumination method in digital holographic interferometry
Keywords: 06.20.-f; 06.20.âf; 06.30.Bp; 42.40.Kw; 42.30.Rx; 42.30.Wb; Shape measurement; Digital holographic interferometry (DHI); Temporal phase unwrapping; Short time Fourier transform (STFT); Complex phasor (CP); Instantaneous frequency;
Evaluation of error in the measurement of displacement vector components by using electronic speckle pattern interferometry
Keywords: 06.20.-f; 06.20.âf; 07.60.Ly; Optical metrology; In-plane and out-of-plane displacements; ESPI; Sensitivity matrix;
Detecting photons: Properties and challenges
Keywords: 06.20.-f; 06.20.âf; Photon counting detectors; Metrology; Correlated photons; Quantum efficiency;
Inspection of a micro-cantilever's opened and concealed profile using integrated vertical scanning interferometry
Keywords: 06.20.-f; 06.20.âf; 06.30.Bp; 07.10.Cm; 07.60.Ly; 42.88.+h; Micro-electro-mechanical systems; Micro-cantilever; Vertical scanning interferometry; Fourier transform; Digital filtering;
Optical edge projection for surface contouring
Keywords: 06.20.-f; 06.20.âf; 06.30.Bp; 07.05.Pj; 42.87.âd; Fringe projection; Optical edge; Surface contouring;
Evaluation of the uncertainty associated with a phase-difference map measured only once by the phase-shifting technique
Keywords: 06.20.-f; 42.87.Bg; 42.30.Ms; 81.70.Fy; 06.20.âf; 02.50.Tt; Phase-shifting; Speckle interferometry; Moiré interferometry; Uncertainty analysis;
First international 26Al interlaboratory comparison - Part II
Keywords: 06.20.-f; 06.20.âf; 07.85.Nc; 91.65.Dt; 96.40.De; 96.40.Vw; 96.50.Mt; Gamma-ray counting; Low-level counting; Cosmogenic radionuclides; Meteorite;