دانلود مقالات ISI درباره 68.55.jd + ترجمه فارسی

Thickness measurement of a thin hetero-oxide film with an interfacial oxide layer by X-ray photoelectron spectroscopy

Keywords: 68.55.jd; 77.84.Bw; 79.60.−i; 06.20.F−; Thickness measurement; HfO2; XPS; Standard metrology;

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2012 سفارش ترجمه

Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

Keywords: 68; 68.47.Fg; 68.55.Nq; 68.55.jd; 77.55.+f; 78.67.−n; 78.68.+m; Spectroscopic ellipsometry; Algorithm; Depth; Profile; Ta2O5 based stack; Interfacial layer; Constituents;

دانلود رایگان متن کامل مقاله ISI 6 صفحه سال انتشار : 2012 سفارش ترجمه

Oxidation studies of niobium thin films at room temperature by X-ray reflectivity

Keywords: 81.05.−t; 61.05.cm; 68.35.ct; 68.55.jd; Nb thin films; Nb2O5; Room temperature oxidation; Nb/Cu cavities; X-ray reflectivity (XRR);

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2010 سفارش ترجمه

Misfit dislocations in an annular film grown on a cylindrical nanowire with different elastic constants

Keywords: 61.72.Lk; 68.55.jd; 62.20.D−; 68.35.GyMisfit dislocations; Nanowire; Critical film thickness

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2009 سفارش ترجمه

Highly oriented (1 0 0) ZnO thin films by spray pyrolysis

Keywords: 78.66.Hf; 61.05.cp; 68.55.ag; 68.55.jd; 68.55.jm; 81.15.Rs; 82.30.Lp; ZnO; Spray pyrolysis; Texture coefficient; Sheet resistivity; Ethanol concentration;

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2009 سفارش ترجمه

Microstructure evolution with RTA temperature in nano-thick (Ru or Au)-inserted nickel silicides

Keywords: 68.55.−a; 68.55.jd; 68.60.−p; 68.65.Ac; A1. Morphological stability; A1. Nanostructures; B1. Nanomaterials; B2. Semiconducting materials; B2. Semiconducting silicon compounds;

دانلود رایگان متن کامل مقاله ISI 6 صفحه سال انتشار : 2009 سفارش ترجمه

Spectroscopic ellipsometry of very thin tantalum pentoxide on Si

Keywords: 68; 68.47.Fg; 68.55.Nq; 68.55.jd; 77.55.+f; 78.67.−n; 78.68.+m; Spectroscopic ellipsometry; Algorithm; High-k; T2O5/Si; Constituents; Depth profile;

دانلود رایگان متن کامل مقاله ISI 6 صفحه سال انتشار : 2009 سفارش ترجمه

Effect of coating thickness on modifying the texture and corrosion performance of hot-dip galvanized coatings

Keywords: 68.55.jm; 68.55.jd; 81.40.wxTexture; Corrosion resistance; Coating thickness; Surface/strain energy; Hot-dip galvanizing; Tafel polarization test

دانلود رایگان متن کامل مقاله ISI 8 صفحه سال انتشار : 2009 سفارش ترجمه

Thermodynamic and experimental investigations on the growth of thick aluminum nitride layers by high temperature CVD

Keywords: A1. Thermodynamic; A1. X-ray diffraction; A3. High temperature chemical vapor deposition, HTCVD; B1. AlN; B1. SiC; B1. Sapphire81.05.Ea; 81.15.Gh; 68.55.J −; 68.55.jd; 68.55.jm; 61.05.cp; 05.70.−a

دانلود رایگان متن کامل مقاله ISI 9 صفحه سال انتشار : 2009 سفارش ترجمه

Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images

Keywords: 68.37Ma; 61.05.jp; 68.55.jd; 68.55.Nq; Quantitative STEM Z-contrast imaging; Composition determination; Multislice simulation; Frozen lattice simulation;

دانلود رایگان متن کامل مقاله ISI 12 صفحه سال انتشار : 2009 سفارش ترجمه