
Resolution enhancing using cantilevered tip-on-aperture silicon probe in scanning near-field optical microscopy
Keywords: 87.64.Xx; 81.15.Ef; 73.61.Ph; 07.79.Pk; 02.70.BfScanning near-field microscopy; Tip-on-aperture (TOA) probe; Electromagnetic field enhancement; Electronic beam-induced deposition (EBID)