Application of a powder diffractometer equipped with a strip detector and Johansson monochromator to phase analysis and structure refinement
Keywords: دیفرکتومتر; 07.85.Fv; 07.85.Nc; 61.10.Nz; 68.55.Nq; Linear detector; Strip detector; X-ray diffraction; Structure refinement; Phase analysis; Defocusing; Diffractometer; Johansson monochromator;