Thermodynamic evolution of antiphase boundaries in GaP/Si epilayers evidenced by advanced X-ray scattering
Keywords: 68.55.ag; 61.72.Dd; 68.37.Ps; 78.70.Ck; X-ray scattering; Growth models; Planar defects; Molecular beam epitaxy; Migration enhanced epitaxy; Semi-conducting III-V materials;