
Energy-filtered real- and k-space secondary and energy-loss electron imaging with Dual Emission Electron spectro-Microscope: Cs/Mo(110)
Keywords: Electron spectromicroscopy; XPEEM; EF-PEEM; Imaging AES; LEEM; DEEM; EELS; Imaging EELS; Imaging ESCA; Momentum mapping; Momentum microscopy;