Rapid thermal annealing effect on the microstructural and optical properties of nc-Si embedded in porous anodic alumina
Keywords: بیضه سنجی طیفی (SE); Porous anodic alumina (PAA); Nanocrystalline silicon (nc-Si); Rapid thermal annealing (RTA); Raman spectroscopy; Spectroscopic ellipsometry (SE); PL;