
Keywords: XPS، طیف سنجی فوتوالکتریک اشعه ایکس; IBSD, ion beam sputtering deposition; NPs, nanoparticles; GO, graphite oxide; DOX, doxorubicin; TC, tetracycline; AFM, atomic force microscopy; SEM, scanning electron microscopy; XPS, X-ray photoelectron spectroscopy; CV, cyclic voltammetry; CVs, cyclic v