کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10364670 | 871773 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Design and process related MIM cap reliability improvement
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
Typically, plots of percent cumulative failure versus failure voltage will be transformed into plots of percent cumulative failure versus lifetime via the above equations. The shapes of these two plots are nearly identical, only the values on the abscissa are changed from (linear) voltage to (logarithmic) lifetime. Since, in this work, the effort was directed at root cause determination of anomalous failures rather than predictions of expected lifetimes, the linear field model was never employed and the data was always plotted as a function of failure voltage.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 55, Issue 12, Part A, December 2015, Pages 2516-2521
Journal: Microelectronics Reliability - Volume 55, Issue 12, Part A, December 2015, Pages 2516-2521
نویسندگان
Justin Parke, Randy Lewis, Kathy Ha, Harlan Cramer, Harold Hearne,