Capacitively coupled transmission line pulsing cc-TLP--a traceable and reproducible stress method in the CDM-domain

This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The cc-TLP results correlate well with the CDM data.