کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10365329 872037 2005 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Real-world printed circuit board ESD failures
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Real-world printed circuit board ESD failures
چکیده انگلیسی
ICs that are robust to ESD at the component-level may be damaged by ESD at the board-level. Two case studies show that real-world Charged Board Model (CBM) ESD damage is typically more severe than Human Body Model (HBM) or Charged Device Model (CDM) ESD damage. Consequently, CBM damage can be easily mistaken for electrical overstress (EOS) damage. A high-capacitance yet compact Printed Circuit Board (PCB) evaluation board facilitates qualitative CBM testing using conventional CDM test systems. Based on the case studies and test results, guidelines are provided on how to minimize the likelihood of real-world CBM failures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 45, Issue 2, February 2005, Pages 287-295
نویسندگان
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