کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10365330 872037 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Transient latch-up: experimental analysis and device simulation
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Transient latch-up: experimental analysis and device simulation
چکیده انگلیسی
A set-up consisting of at least one pulse generator with baseline functionality was used for transient latch-up (TLU) investigations. Dependencies of the TLU sensitivity of test structures on the pulse width and the rise time have been analyzed. Device simulation could reproduce the tendencies and reveals the root cause for the dependencies. In a bipolar product, which is immune against static latch-up, transient latch-up could be triggered, showing clearly the importance of a TLU characterization and the capability of the set-up.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 45, Issue 2, February 2005, Pages 297-304
نویسندگان
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