کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10365736 | 872166 | 2014 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A fast, flexible, and easy-to-develop FPGA-based fault injection technique
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
By technology down scaling in nowadays digital circuits, their sensitivity to radiation effects increases, making the occurrence of soft errors more probable. As a consequence, soft error rate estimation of complex circuits such as processors is becoming an important issue in safety- and mission-critical applications. Fault injection is a well-known and widely used approach for soft error rate estimation. Development of previous FPGA-based fault injection techniques is very time consuming mainly because they do not adequately exploit supplementary FPGA tools. This paper proposes an easy-to-develop and flexible FPGA-based fault injection technique. This technique utilizes debugging facilities of Altera FPGAs in order to inject single event upset (SEU) and multiple bit upset (MBU) fault models in both flip-flops and memory units. As this technique uses FPGA built-in facilities, it imposes negligible performance and area overheads on the system. The experimental results show that the proposed technique is on average four orders of magnitude faster than a pure simulation-based fault injection. These features make the proposed technique applicable to industrial-scale circuits.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 54, Issue 5, May 2014, Pages 1000-1008
Journal: Microelectronics Reliability - Volume 54, Issue 5, May 2014, Pages 1000-1008
نویسندگان
Mojtaba Ebrahimi, Abbas Mohammadi, Alireza Ejlali, Seyed Ghassem Miremadi,