RMS detector of periodic, band-limited signals based on usage of DO-CCIIs

The paper presents a completely new realization of implicit RMS detector, employing dual-output second-generation current conveyors (DO-CCIIs) and metal-oxide-semiconductor transistors. The proposed circuit can be applied in measuring the RMS value of multiharmonic signals. To verify the theoretical analysis, the circuit SPICE simulations and experimental results have also been included, showing good agreement with the theory. The errors related to the signal processing and errors bound were investigated and provided. A processing precision of 0.05% was achieved. Inherently, the circuit is well suited for IC implementation.