کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10408929 893748 2005 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Analysis by speckle interferometry of the dependency of yield stress on residual stress
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Analysis by speckle interferometry of the dependency of yield stress on residual stress
چکیده انگلیسی
We used electronic speckle pattern interferometry (ESPI) to measure in situ displacement fields nondestructively and with high resolution (∼10−2 μm) by using the interferometry principle and the phase-shift technique. We measured the depth profile of the residual stress in steel pipe manufactured by thermomechanically controlled processing using a quantitative model, which explains the relationship between residual stress and displacement measured by ESPI in chemical etching. We analyzed the variation of yield stresses measured by the indentation technique and the residual stresses at various depths. The relationship between the residual stresses and the yield stresses was consistent with simulated results and can be used for indirect evaluation of the residual stresses from the yield stresses.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 43, Issue 2, February 2005, Pages 221-232
نویسندگان
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