Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration

In this research we implemented a two windows interferometer based on polarization phase shifting and grating interferometry techniques in order to retrieve the phase data profile of the object in a single capture. The optical configuration has two optical beams with circular polarization in opposite directions, and it is coupled with a 4-f system. An amplitude grid is used as a filter which is placed at the Fourier plane to obtain replicas of each beam which can properly interfere, depending on the separation between beams. The interferometer presents the capability of changing the beam separation in order to make different orders interfere properly. The interference patterns produced can be separately modulated through the operation of linear polarizer's placed on each interference replica. In order to present the capabilities of the system we will select four interferograms result of contiguous orders interference.