AC characterization of organic thin-film transistors with asymmetric gate-to-source and gate-to-drain overlaps

► Dynamic characterization of OTFTs is demonstrated by S-parameter measurements. ► OTFT small-signal model simulations fit the S-parameter measurements closely. ► Impact of contact misalignment on the dynamic performance of OTFTs is investigated. ► Misalignment is controlled by an OTFT process that is based on silicon stencil masks. ► Actual contact misalignment of OTFTs can be extracted from S-parameter measurements.