Quantification of deep hole-trap filling by molecular p-doping: Dependence on the host material purity

Quantification of deep hole-trap filling by molecular p-doping: Dependence on the host material purity

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Organic Electronics - Volume 14, Issue 9, September 2013, Pages 2348-2352

Max L. Tietze, Karl Leo, Björn Lüssem,