Exploring the potential of ellipsometry for the characterisation of electronic, optical, morphologic and thermodynamic properties of polyfluorene thin films

We also demonstrate the use of ellipsometry for measuring the glass and crystalline phase transition temperatures of PFO and report the dependence of the polymer refractive index on temperature: the large dn/dT of PFO could be used to add functionality to optoelectronic/photonic devices.