Determination of carrier mobility in MEH-PPV thin-films by stationary and transient current techniques

► We apply stationary and transient current techniques to investigate mobility. ► MEH-PPV light-emitting diode shelf-degradation is studied. ► Carrier mobility is studied through ToF, CELIV, DI-SCLC, JxV and FET. ► Techniques are applied to thin-films and thick layers. ► Results are comparable to other PPV derivatives in literature.