کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10633703 993050 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
On the mechanism of electroluminescence excitation in Er-doped SiO2 containing silicon nanoclusters
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
On the mechanism of electroluminescence excitation in Er-doped SiO2 containing silicon nanoclusters
چکیده انگلیسی
The effect of the density of silicon nanoclusters on both electroluminescence (EL) and photoluminescence (PL) of Er3+ ions in indium-tin oxide/SiO2:Er/n-type silicon metal-oxide-semiconductor structures was studied by co-implantation of excess silicon into a 200 nm SiO2 layer with a concentration in the range of 1-15%. Contrary to the PL, the EL from both the green and infrared peaks of Er3+ shows a dramatic quenching when the average distance between the silicon clusters decreases below 3 nm. In addition, electric-field-induced quenching of the photoluminescence from silicon clusters and Er3+ is observed. These results indicate that the EL excitation process of Er3+ ions is governed by the direct impact excitation by hot electrons. An increase of the silicon nanocluster density causes direct tunneling of electrons between silicon clusters, thus reducing the population of energetic hot electrons for impact excitation of Er3+ ions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optical Materials - Volume 27, Issue 5, February 2005, Pages 1050-1054
نویسندگان
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